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| United States Patent | 6,916,598 |
| Wang | July 12, 2005 |
This invention discloses compositions that can be polymerized/crosslinked imagewise upon exposure to ionization radiation such as x-ray, electron beam, ion beam, and gamma-ray. This invention also discloses methods of use for these compositions for microfabrication of ceramics, for stereolithography, and for x-ray, e-beam, and ion-beam lithography which can be used for photoresists.
| Inventors: | Wang; Ying (Wilmington, DE) |
|---|---|
| Assignee: |
E. I. du Pont de Nemours and Company
(Wilmington,
DE)
|
| Family ID: | 26800054 |
| Appl. No.: | 10/394,060 |
| Filed: | March 21, 2003 |
| Application Number | Filing Date | Patent Number | Issue Date | ||
|---|---|---|---|---|---|
| 314435 | May 18, 1999 | 6569602 | |||
| Current U.S. Class: | 430/325; 264/401; 430/280.1; 430/281.1; 430/283.1; 430/284.1; 430/285.1; 430/311; 430/313; 430/314; 430/330; 430/331; 430/905; 430/906; 430/907; 430/909; 430/910; 430/942; 430/945; 430/953; 430/966; 430/967 |
| Current CPC Class: | G03F 7/0037 (20130101); G03F 7/027 (20130101); G03F 7/038 (20130101); B33Y 70/00 (20141201); Y10S 430/143 (20130101); Y10S 430/146 (20130101); Y10S 430/167 (20130101); Y10S 430/11 (20130101); Y10S 430/108 (20130101); Y10S 430/168 (20130101); Y10S 430/111 (20130101); Y10S 430/107 (20130101); Y10S 430/154 (20130101); Y10S 430/106 (20130101) |
| Current International Class: | G03F 7/027 (20060101); G03F 7/00 (20060101); G03F 7/038 (20060101); G03C 001/725 (); G03C 001/73 (); G03F 007/027 (); G03F 007/032 (); G03F 007/30 () |
| Field of Search: | ;430/281.1,280.1,283.1,284.1,285.1,905,906,907,909,910,966,967,942,953,325,313,311,330,331,314,945 ;264/401 |
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